index
:
~alexl/cairo
device-scale
device-scale2
ickle-device-scale
master
Unnamed repository; edit this file 'description' to name the repository.
alexl
summary
refs
log
tree
commit
diff
log msg
author
committer
range
path:
root
/
test
/
pattern-getters.c
Age
Commit message (
Expand
)
Author
Files
Lines
2011-03-17
test: Use ARRAY_LENGTH() macro
Andrea Canciani
1
-1
/
+1
2011-02-07
mesh: Rename cairo_pattern_mesh_* functions to cairo_mesh_pattern_*
Andrea Canciani
1
-17
/
+17
2011-01-01
test: Extend pattern-get-type and pattern-getters for mesh patterns
Andrea Canciani
1
-0
/
+82
2009-03-18
[test] Destroy pattern on error paths.
Chris Wilson
1
-4
/
+25
2008-10-31
[test] Build test suite into single binary.
Chris Wilson
1
-14
/
+6
2008-08-13
[test] Preparatory work for running under memfault.
Chris Wilson
1
-6
/
+7
2008-01-29
Fix undefined macro that was preventing the tests from compiling
Adrian Johnson
1
-14
/
+14
2008-01-28
Fix bitmap-font test by using near-equality for double comparison
Carl Worth
1
-3
/
+1
2007-03-13
[test] In pattern-getters test, log what went wrong
Behdad Esfahbod
1
-3
/
+11
2007-03-02
Fix leak in pattern-getters test (missing cairo_pattern_destroy)
Carl Worth
1
-0
/
+2
2006-10-12
Fix typo of , instead of || which was causing a test to be ignored
Carl Worth
1
-4
/
+4
2006-09-19
dash and pattern getter functions
Vladimir Vukicevic
1
-0
/
+175