diff options
author | Grant Likely <grant.likely@linaro.org> | 2015-03-27 20:30:04 -0700 |
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committer | Grant Likely <grant.likely@linaro.org> | 2015-03-29 08:56:20 +0100 |
commit | 37791b6fbe7ab772020e714d34515f144fa981a0 (patch) | |
tree | 32b4e3426cd3112e705c63e8ea02f93c101516a3 /drivers/nfc | |
parent | 716e1d493a8717251158c708b2f161017bdcb3f9 (diff) |
of/unittest: Fix of_platform_depopulate test case
The previous commit, "of/unittest: early return from test skips tests"
exposed broken tests for the of_platform_unpopulate() function. The
problem was the populate and depopulate calls were not symmetrical like
they were intended to be, and unpopulate depends on the parent device to
have it's of_node pointer pointing to the parent device node. Fix these
bugs so that the test case works correctly.
In the process, the test_bus used as a container for the test devices
has been changed from a statically allocated struct device (which is
bad) to a properly allocated device with a .release() method (which is
good). This stops the test code from being a bad example of abusing the
device model.
Signed-off-by: Grant Likely <grant.likely@linaro.org>
Cc: Frank Rowand <frank.rowand@sonymobile.com>
Cc: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Cc: Pawel Moll <pawel.moll@arm.com>
Diffstat (limited to 'drivers/nfc')
0 files changed, 0 insertions, 0 deletions