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author | David Brownell <david-b@pacbell.net> | 2006-07-06 15:48:53 -0700 |
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committer | Greg Kroah-Hartman <gregkh@suse.de> | 2006-07-12 16:03:24 -0700 |
commit | a353678d3136306c1d00f0d2319de1dac8a6b1db (patch) | |
tree | ee68e60ab3611053ba91aedd74e673337601760d /drivers/dio/dio.c | |
parent | 5501a48c15d4a3b81bee1358eb195e26c798d78f (diff) |
[PATCH] USB: gadget section fixups
Recent section changes broke gadget builds on some platforms. This patch
is the best fix that's available until better section markings exist:
- There's a lot of cleanup code that gets used in both init and exit paths;
stop marking it as "__exit".
(Best fix for this would be an "__init_or_exit" section marking, putting
the cleanup in __init when __exit sections get discarded else in __exit.)
- Stop marking the use-once probe routines as "__init" since references
to those routines are not allowed from driver structures. They're now
marked "__devinit", which in practice is a net lose.
(Best fix for this is likely to separate such use-once probe routines
from the driver structure ... but in general, all busses that aren't
hotpluggable will be forced to waste memory for all probe-only code.)
In general these broken section rules waste an average of two to four kBytes
per driver of code bloat ... because none of the relevant code can ever be
reused after module initialization.
Signed-off-by: David Brownell <dbrownell@users.sourceforge.net>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>
Diffstat (limited to 'drivers/dio/dio.c')
0 files changed, 0 insertions, 0 deletions